Surface inspection in IR light

Surface inspection in IR light unit

The installation is designed for one-time quality control of bonding the entire surface of substrates of various shapes up to 200 mm in size with a resolution (pixel size) of 200x200 microns.

Key features and capabilities:

• one-time inspection of the entire area of ​​the samples from pieces to plates with a diameter of 100, 150 and 200 mm;
• a source of infrared radiation with a wavelength of incident radiation of 1 micron;
• minimum visible size (1 pixel) - 200 microns;
• field of view (diameter) - 200 mm;
• selection of a field of view from 20 mm to 200 mm;
• image capture, display and image analysis software.